Atomic Force Microscopy in Adhesion Studies
Drelich, Jaroslaw, Mittal, Kash L.(eds.)
Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies.
Категорії:
Рік:
2005
Видавництво:
VSP - An imprint of BRILL
Мова:
english
Сторінки:
811
ISBN 10:
906764434X
ISBN 13:
9789067644341
Файл:
PDF, 41.07 MB
IPFS:
,
english, 2005