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Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

Name: Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis
ISBN: 9781848167896

Nobuo Tanaka

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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.

Категорії:

Engineering

Рік:

2014

Видавництво:

Imperial College Press

Мова:

english

Сторінки:

400

ISBN 10: